Influenced of cultural practices on leaf blight disease severity (xanthomonas oryzae pv. Oryzae) and yield of psbrc72h

The study influenced of cultural practices on leaf blight disease (Xanthomonas oryzae pv. oryzae) severity and yield of PSBRc72H was conducted to identify combinations of different cultural practices that will gave conditions unfavorable to bacterial leaf blight disease and its’ influence on the agronomic characteristics and yield of PSBRc72H. The experiment was laid out in strip – split plot arranged in Randomized Complete block Design (RCBD) replicated three times The analyses showed the following findings: 1. The applications of controlled irrigation practices such as applied once a week, saturated and intermittent, any of the four NPK rates (80-60-120, 100-60-120, 80-80-140 and 100-80-140) and planting at 20 x 30 and 30 x 30 cm gave conditions unfavorable to bacterial leaf blight disease. 2. The applications of controlled irrigation practices such as applied once a week, saturated and intermittent and any of the four NPK rates (80-60-120, 100-60-120, 80-80-140 and 100-80-140) did not affect the following agronomic characteristics: number of tillers at 30 and 60 DAT, unproductive and productive tillers and the number of days to heading. However, plant heights became taller when irrigated continuously. The number of tillers at 30 and 60 DAT and unproductive tillers were lesser, the plant height and number of days to heading were shorter when planted at a closer distance (20 x 20 cm) and more tillers at 30 and 60 DAT and unproductive tillers, taller plant height and longer number of days to heading when planted at a wider distance (20 x 30 and 30 x 30 cm). On the other hand, yield was higher if applied with continuous irrigation and planted at 20 x 20 and 20 x 30 cm than applied with a controlled irrigation such as intermittent, saturated and once a week and planted at wider distance (30 x 30 cm). Applications of any of the four NPK rates (80-60-120, 100-60-120, 80-80-140 and 100-80-140) did not affect the yield.