Study of oxidation behavior of lead thin films by thermal evaporation method

The lead thin films were deposited onto amorphous glass substrate using a vacuum thermal deposition technique by varying annealing time to study its oxidation behaviour. The XRD pattern clearly exhibited the phase changes in accordance with the annealing time and reaches the menopause of PbO at a maximum annealing time. The surface morphology, particle size and uniformity of the films were ascribed from SEM micrograms. The change in surface morphology or topography with the function of oxidation time was observed from amplitude and functional parameters. The optical UV-Vis spectra showed that the directly allowed transitions band gap values were decreased due to the rise of annealing time. The functional groups were analysed by using FT-IR techniques.