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Calibration of a three-detector microwave ellipsometer

Author:

A. Moungache, 1B. Bayard, Abakar Mahamat Tahir, C. Thron , S. Robert, F. Gambou

Subject Area:

Physical Sciences and Engineering

Abstract:

The three-detector microwave ellipsometer working at 30 GHz frequency is an experimental bench used to characterize dielectric materials. This paper is aimed at showing the reliability of the measurement of this original bench. Thus, the latter is described first. Then, error sources and their influences on the measurement are studied. We finally show that a numerical correction used for calibration guaranties the reliability of the measurement.

PDF file:

33215.pdf

DOI: https://doi.org/10.24941/ijcr.33215.12.2018

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