LabVIEW based cost effective simultaneous data acquisition system: measurement of C-V of the ferrite thin films

The main purpose of work is to develop low cost and portable PC interfaced data acquisition and monitoring system especially for C-V measurement of the ferrite thin films. Data acquisition system (DAS) consist of microcontroller AT89S52, Two ADC (0804) and DAC as sweep generation for C-V measurement, data acquisition system must acquire two parameters simultaneously i.e. cos wave reference signal and sin wave reference signal which incorporates phase and amplitude information. Data acquisition system acquire serially and send to PC with LabVIEW. LabVIEW GUI is developed to process the data and display the value of phase and amplitude of waveform and other relative electrical parameters of device under test (DUT), this also utilize for simultaneous measurement of any two physical parameters in general, which is essential most of the time in the research lab, the device is able to acquire two different physical parameters at the same instant and data logging with PC using USB port and processing of the signals using LabVIEW.